✦ LIBER ✦
Impact of Mechanical Strain on GIFBE in PD SOI p-MOSFETs as Indicated From NBTI Degradation
✍ Scribed by Wen-hung Lo; Ting-Chang Chang; Chih-Hao Dai; Wan-Lin Chung; Ching-En Chen; Szu-Han Ho; Cheng, O.; Cheng Tung Huang
- Book ID
- 119799684
- Publisher
- IEEE
- Year
- 2012
- Tongue
- English
- Weight
- 410 KB
- Volume
- 33
- Category
- Article
- ISSN
- 0741-3106
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