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On diagnosing multiple stuck-at faults using multiple and single fault simulation in combinational circuits

✍ Scribed by Takahashi, H.; Boateng, K.O.; Saluja, K.K.; Takamatsu, Y.

Book ID
119778882
Publisher
IEEE
Year
2002
Tongue
English
Weight
179 KB
Volume
21
Category
Article
ISSN
0278-0070

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πŸ“œ SIMILAR VOLUMES

A method of diagnosing single stuck-at f
A method of diagnosing single stuck-at faults in combinational circuits
✍ Teruhiko Yamada; Yoshiyuki Nakamura πŸ“‚ Article πŸ“… 1992 πŸ› John Wiley and Sons 🌐 English βš– 618 KB

## Abstract A new method is proposed to diagnose single stuck‐at faults in combinational circuits. In this method, based on the operations of the nonfaulty circuit, first the possible faulty paths are examined from the primary outputs, at which errors have been observed, toward the primary inputs t