✦ LIBER ✦

On-Chip Aging Sensor Circuits for Reliable Nanometer MOSFET Digital Circuits

✍ Scribed by Kim, Kyung Ki ;Wang, Wei ;Choi, Ken

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Impact of MOSFET gate oxide breakdown on

✍ Kaczer, B.; Degraeve, R.; Rasras, M.; Van de Mieroop, K.; Roussel, P.J.; Groesen 📂 Article 📅 2002 🏛 IEEE 🌐 English ⚖ 173 KB

Reliability Evaluation for Single Event

✍ Baojun Liu, ; Li Cai, 📂 Article 📅 2012 🏛 IEEE 🌐 English ⚖ 860 KB

High-accuracy circuits for on-chip capac

✍ Bo Wang; Tetsuya Kajita; Tao Sun; Temes, G. 📂 Article 📅 1998 🏛 IEEE 🌐 English ⚖ 172 KB

High-accuracy circuits for on-chip capac

✍ Yuming Cao, ; Temes, G.C. 📂 Article 📅 1994 🏛 IEEE 🌐 English ⚖ 294 KB

Calibrating On-chip Thermal Sensors in I

✍ Chunhua Yao; Kewal K. Saluja; Parmesh Ramanathan 📂 Article 📅 2011 🏛 Springer US 🌐 English ⚖ 333 KB

A process variation compensating techniq

✍ Kim, C.H.; Roy, K.; Hsu, S.; Krishnamurthy, R.; Borkar, S. 📂 Article 📅 2006 🏛 IEEE 🌐 English ⚖ 678 KB