✦ LIBER ✦

Impact of MOSFET gate oxide breakdown on digital circuit operation and reliability

✍ Scribed by Kaczer, B.; Degraeve, R.; Rasras, M.; Van de Mieroop, K.; Roussel, P.J.; Groeseneken, G.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Analysis and modeling of a digital CMOS

✍ B. Kaczer; R. Degraeve; M. Rasras; A. De Keersgieter; K. Van de Mieroop; G. Groe 📂 Article 📅 2002 🏛 Elsevier Science 🌐 English ⚖ 346 KB

Gate Oxide Wear-Out and Breakdown Effect

✍ Fernandez, R.; Martin-Martinez, J.; Rodriguez, R.; Nafria, M.; Aymerich, X.H. 📂 Article 📅 2008 🏛 IEEE 🌐 English ⚖ 623 KB

Fast Vth Instability in HfO2 Gate Dielec

✍ Chen Shen; Tian Yang; Ming-Fu Li; Xinpeng Wang; C. E. Foo; Ganesh S. Samudra; Ye 📂 Article 📅 2006 🏛 IEEE 🌐 English ⚖ 385 KB

Impact of Crystalline Phase of Ni-FUSI G

✍ Masayuki Terai; Takashi Onizawa; Setsu Kotsuji; Nobuyuki Ikarashi; Akio Toda; Sh 📂 Article 📅 2007 🏛 IEEE 🌐 English ⚖ 534 KB

Impact of gate fan-in and fan-out limits

✍ Ji, Lianhua ;Heuring, V. P. 📂 Article 📅 1997 🏛 The Optical Society 🌐 English ⚖ 548 KB

Impact of gate poly doping and oxide thi

✍ Gregor Pobegen; Thomas Aichinger; Tibor Grasser; Michael Nelhiebel 📂 Article 📅 2011 🏛 Elsevier Science 🌐 English ⚖ 496 KB