✦ LIBER ✦
Fast Vth Instability in HfO2 Gate Dielectric MOSFETs and Its Impact on Digital Circuits
✍ Scribed by Chen Shen; Tian Yang; Ming-Fu Li; Xinpeng Wang; C. E. Foo; Ganesh S. Samudra; Yee-Chia Yeo; Dim-Lee Kwong
- Book ID
- 114618528
- Publisher
- IEEE
- Year
- 2006
- Tongue
- English
- Weight
- 385 KB
- Volume
- 53
- Category
- Article
- ISSN
- 0018-9383
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