✦ LIBER ✦
A process variation compensating technique with an on-die leakage current sensor for nanometer scale dynamic circuits
✍ Scribed by Kim, C.H.; Roy, K.; Hsu, S.; Krishnamurthy, R.; Borkar, S.
- Book ID
- 120376771
- Publisher
- IEEE
- Year
- 2006
- Tongue
- English
- Weight
- 678 KB
- Volume
- 14
- Category
- Article
- ISSN
- 1063-8210
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