High-accuracy circuits for on-chip capacitive ratio testing and sensor readout

✍ Scribed by Bo Wang; Tetsuya Kajita; Tao Sun; Temes, G.

• Book ID: 114543960
• Publisher: IEEE
• Year: 1998
• Tongue: English
• Weight: 172 KB
• Volume: 47
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/19.728781