High-accuracy circuits for on-chip capacitance ratio testing or sensor readout

✍ Scribed by Yuming Cao, ; Temes, G.C.

• Book ID: 120578593
• Publisher: IEEE
• Year: 1994
• Tongue: English
• Weight: 294 KB
• Volume: 41
• Category: Article
• ISSN: 1057-7130
• DOI: 10.1109/82.326597