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Observations of dislocations and junction irregularities in bipolar transistors using the OBIC mode of the scanning optical microscope

✍ Scribed by T. Wilson; C.J.R. Sheppard

Publisher: Elsevier Science
Year: 1986
Tongue: English
Weight: 790 KB
Volume: 29
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(86)90063-8

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