Observations of dislocations and junction irregularities in bipolar transistors using the E.B.I.C. mode of the scanning electron microscope : P. Ashburn and C. J. Bull. Solid-St. Electron. 22, 105 (1979)

• Publisher: Elsevier Science
• Year: 1979
• Tongue: English
• Weight: 124 KB
• Volume: 19
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(79)90298-1