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Observations of dislocations and junction irregularities in bipolar transistors using the E.B.I.C. mode of the scanning electron microscope

✍ Scribed by P. Ashburn; C.J. Bull

Publisher: Elsevier Science
Year: 1979
Tongue: English
Weight: 718 KB
Volume: 22
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(79)90179-5

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