Observation of dislocations in a silicon phototransistor by scanning electron microscopy using the barrier electron voltaic effect : D. B. Holt and R. Ogden. Solid State Electronics19, 37 (1976)

• Publisher: Elsevier Science
• Year: 1976
• Tongue: English
• Weight: 121 KB
• Volume: 15
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(76)90355-3