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Observation of dislocations in a silicon phototransistor by scanning electron microscopy using the barrier electron voltaic effect

✍ Scribed by D.B. Holt; R. Ogden

Publisher: Elsevier Science
Year: 1976
Tongue: English
Weight: 427 KB
Volume: 19
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(76)90130-1

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