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The effect of cooling rate on the surface reconstruction of annealed silicon(111) studied by scanning tunneling microscopy and low-energy electron diffraction: M D Pashley et al, J Vac Sci Technol, A6, 1988, 488–492


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
149 KB
Volume
39
Category
Article
ISSN
0042-207X

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