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1110. Scanning electron microscopy observation of the influence of silicon whisker bombardment by phosphorus ions: I P Bogoyalenskaya et al, Coll of works on semicon materials, def and appl, Voronezh 1973, 115–118 (in Russian)


Publisher
Elsevier Science
Year
1975
Tongue
English
Weight
134 KB
Volume
25
Category
Article
ISSN
0042-207X

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