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Numerical simulation of parasitic resistance effects in polycrystalline silicon TFTs

✍ Scribed by Gaucci, P.; Valletta, A.; Mariucci, L.; Fortunato, G.; Brotherton, S.D.

Book ID: 114618131
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 256 KB
Volume: 53
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2005.864365

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