Characterization of Intrinsic Field-Effect Mobility in TFTs by De-Embedding the Effect of Parasitic Source and Drain Resistances

✍ Scribed by Hur, Inseok; Bae, Hagyoul; Kim, Woojoon; Kim, Jaehyeong; Jeong, Hyun Kwang; Jo, Chunhyung; Jun, Sungwoo; Lee, Jaewook; Kim, Yun Hyeok; Kim, Dae Hwan; Kim, Dong Myong

• Book ID: 118280007
• Publisher: IEEE
• Year: 2013
• Tongue: English
• Weight: 557 KB
• Volume: 34
• Category: Article
• ISSN: 0741-3106
• DOI: 10.1109/led.2012.2226424