✦ LIBER ✦
Effects of the timing of AC stress on device degradation produced by trap states in low-temperature polycrystalline-silicon TFTs
✍ Scribed by Toyota, Y.; Shiba, T.; Ohkura, M.
- Book ID
- 114617914
- Publisher
- IEEE
- Year
- 2005
- Tongue
- English
- Weight
- 470 KB
- Volume
- 52
- Category
- Article
- ISSN
- 0018-9383
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