𝔖 Bobbio Scriptorium
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Nature of defects in silicon implanted with boron ions: T P Timasheca et al, Struct Defects in Semicon, Coll, Novosibirsk 1973, 274–277 (in Russian)


Publisher
Elsevier Science
Year
1975
Tongue
English
Weight
162 KB
Volume
25
Category
Article
ISSN
0042-207X

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