𝔖 Bobbio Scriptorium

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Investigation of defects in ion-implanted silicon by electrochemical methods: P V Pavlov et al, Struct Defects in Semicon, Coll, Novosibirsk 1973, 251–254 (in Russian)

Publisher: Elsevier Science
Year: 1975
Tongue: English
Weight: 162 KB
Volume: 25
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(75)91458-x

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