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Investigation of radiation defects in silicon and silicon oxide generated on ion implantation: I Gyulay et al, Struct Defects in Semicon, Coll, Novosibirsk 1973, 273 (in Russian)


Publisher
Elsevier Science
Year
1975
Tongue
English
Weight
139 KB
Volume
25
Category
Article
ISSN
0042-207X

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