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Multi-frequency electron spin resonance analysis of interfacial Ge dangling bond defects in condensation-grown (1 0 0)Si/SiO 2 /Si 1– x Ge x /SiO 2

✍ Scribed by Stesmans, A; Somers, P; Afanas’ev, V V


Book ID
120213134
Publisher
Institute of Physics
Year
2012
Tongue
English
Weight
275 KB
Volume
28
Category
Article
ISSN
0268-1242

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