Comparative analysis of thermally induced degradation of condensation-grown (100)Ge0.75Si0.25/SiO2 interfaces by electron spin resonance

✍ Scribed by Kepa, J.; Stesmans, A.; Afanas’ev, V.V.

• Book ID: 123433701
• Publisher: Elsevier Science
• Year: 2014
• Tongue: English
• Weight: 602 KB
• Volume: 291
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/j.apsusc.2013.08.074