𝔖 Bobbio Scriptorium
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Monte Carlo simulation of process parameters in electron beam lithography for thick resist patterning

✍ Scribed by J. Zhou; X. Yang


Book ID
121861561
Publisher
AVS (American Vacuum Society)
Year
2006
Tongue
English
Weight
911 KB
Volume
24
Category
Article
ISSN
0734-211X

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