The electron backscattering coefficients of thin tri-level-process layer systems in the energy range from 2.5 to 40.0 keV have been calculated by Monte Carlo simulations. The results show a significant variation of the backscattering with the primary electron energy and the atomic number of the mate
β¦ LIBER β¦
New approach of Monte Carlo simulation for low energy electron beam lithography
β Scribed by Soo-Hwan Kim; Young-Mog Ham; Wongyu Lee; Kukjin Chun
- Book ID
- 114155766
- Publisher
- Elsevier Science
- Year
- 1998
- Tongue
- English
- Weight
- 262 KB
- Volume
- 41-42
- Category
- Article
- ISSN
- 0167-9317
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