Molecular Beam Epitaxial Growth of Topological Insulators
โ Scribed by Xi Chen; Xu-Cun Ma; Ke He; Jin-Feng Jia; Qi-Kun Xue
- Publisher
- John Wiley and Sons
- Year
- 2011
- Tongue
- English
- Weight
- 318 KB
- Volume
- 23
- Category
- Article
- ISSN
- 0935-9648
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
GaN films are grown by plasma-assisted molecular beam epitaxy on 6H-SiC(0001) substrates. Suitable substrate preparation and growth conditions are found which greatly improve the structural quality of the films. Threading dislocation densities of about 1 ร 10 9 cm --2 for edge dislocations and 1 ร 1
The value of in situ monitoring to study growth dynamics and surface reaction kinetics in a gas source molecular beam epitaxy process is illustrated with reference to the growth of Si ยฎlms on Si(001) substrates using a beam of disilane (Si 2 H 6 ). By using a combination of reยฏection high-energy ele
The structural properties as well as epitaxial growth peculiarities of thin film silicon-based heterostructures (SBH) are described with emphasis put on MBE growth of these structures. More detailed considerations are presented for the strained-layer Si 1-x Ge x /Si heterostructures. The 4.17% latti