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Modelling the dielectric function of thin films measured by spectroscopic ellipsometry: determination of microstructure and density

✍ Scribed by T. Haage, U. I. Schmidt, B. Schröder…


Book ID
120751761
Publisher
Springer
Year
1995
Tongue
English
Weight
344 KB
Volume
353
Category
Article
ISSN
1618-2650

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