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Characterization of amorphous organic thin films, determination of precise model for spectroscopic ellipsometry measurements

✍ Scribed by Azadeh Farahzadi; Maryam Beigmohamadi; Phenwisa Niyamakom; Stephan Kremers; Nico Meyer; Michael Heuken; Matthias Wuttig

No coin nor oath required. For personal study only.

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