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Measurement of the dielectric constant of thin films by terahertz time-domain spectroscopic ellipsometry

✍ Scribed by Matsumoto, Naoki; Hosokura, Tadasu; Nagashima, Takeshi; Hangyo, Masanori

Book ID: 115434173
Publisher: Optical Society of America
Year: 2011
Tongue: English
Weight: 375 KB
Volume: 36
Category: Article
ISSN: 0146-9592
DOI: 10.1364/OL.36.000265

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