Dielectric function and critical points of AlP determined by spectroscopic ellipsometry

✍ Scribed by Hwang, S.Y.; Kim, T.J.; Jung, Y.W.; Barange, N.S.; Park, H.G.; Kim, J.Y.; Kang, Y.R.; Kim, Y.D.; Shin, S.H.; Song, J.D.; Liang, C.-T.; Chang, Y.-C.

• Book ID: 122311532
• Publisher: Elsevier Science
• Year: 2014
• Tongue: English
• Weight: 491 KB
• Volume: 587
• Category: Article
• ISSN: 0925-8388
• DOI: 10.1016/j.jallcom.2013.10.205