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Determination of the complex dielectric function of ion implanted amorphous SiC by spectroscopic ellipsometry

✍ Scribed by Shaaban, E. R. ;Lohner, T. ;Petrik, P. ;Khánh, N. Q. ;Fried, M. ;Polgár, O. ;Gyulai, J.

No coin nor oath required. For personal study only.

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