Spectroscopic ellipsometry has been used to determine the optical constants-complex dielectric constant (e\* = e 1 + e 2 ), refractive index (n), extinction coefficient (k), absorption coefficient (a) and normal incidence reflectivity (R)-of two-source vacuum-evaporated polycrystalline Cd 1 Γx Zn x
Determination and analysis of the optical constants of thin films of nickel(II) and copper(II) hydrazone complexes by spectroscopic ellipsometry
β Scribed by Z.M. Chen; Y.Q. Wu; D.H. Gu; F.X. Gan
- Publisher
- Springer
- Year
- 2007
- Tongue
- English
- Weight
- 691 KB
- Volume
- 88
- Category
- Article
- ISSN
- 1432-0630
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π SIMILAR VOLUMES
Stability constants of Copper(B), Nickel(B), Cohalt(II), Zinc(II), Uranyl(II) and Thorium(IV) a&pates have heen determined by paper electrophoresis. Adipic acid (0.005 mol dmm3) was added to the background electrolyte: 0.1 moldm-3 HC104. The proportions of (CH,),COOH COO-and (CH,),C,O; were varied b
The conventional ellipsometry can be applied to determine the optical properties of anisotropic materials only if the measurements are made for in-plane uniaxial anisotropy of the bulk sample with the optic axis parallel or perpendicular to the plane of incidence. For arbitrarily oriented anisotropi