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Systematic differences among nominal reference dielectric function spectra for crystalline Si as determined by spectroscopic ellipsometry

✍ Scribed by K.A. Bell; L. Mantese; U. Rossow; D.E. Aspnes


Book ID
114086300
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
193 KB
Volume
313-314
Category
Article
ISSN
0040-6090

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