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Modeling the dielectric functions of silicon-based films in the amorphous, nanocrystalline and microcrystalline regimes

✍ Scribed by A.S. Ferlauto; Joohyun Koh; P.I. Rovira; C.R. Wronski; R.W. Collins; Gautam Ganguly

No coin nor oath required. For personal study only.

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