✦ LIBER ✦
Raman characterization of the structural evolution in amorphous and partially nanocrystalline hydrogenated silicon thin films prepared by PECVD
✍ Scribed by Zhi Li; Wei Li; Yadong Jiang; Haihong Cai; Yuguang Gong; Jian He
- Publisher
- John Wiley and Sons
- Year
- 2011
- Tongue
- English
- Weight
- 428 KB
- Volume
- 42
- Category
- Article
- ISSN
- 0377-0486
- DOI
- 10.1002/jrs.2711
No coin nor oath required. For personal study only.