Modeling and Parameter Extraction for the Series Resistance in Thin-Film Transistors

✍ Scribed by Keum-Dong Jung; Yoo Chul Kim; Byung-Gook Park; Hyungcheol Shin; Jong Duk Lee

• Book ID: 114619295
• Publisher: IEEE
• Year: 2009
• Tongue: English
• Weight: 464 KB
• Volume: 56
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2008.2010579