Parameter extraction method for universal amorphous silicon thin-film transistors simulation program with integrated circuit emphasis model

✍ Scribed by Jin, J.W.; Oudwan, M.; Daineka, D.; Moustapha, O.; Bonnassieux, Y.

• Book ID: 114442614
• Publisher: The Institution of Engineering and Technology
• Year: 2012
• Tongue: English
• Weight: 118 KB
• Volume: 6
• Category: Article
• ISSN: 1751-858X
• DOI: 10.1049/iet-cds.2011.0124