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Modeling the gate bias dependence of contact resistance in staggered polycrystalline organic thin film transistors

✍ Scribed by Vincenzo Vinciguerra; Manuela La Rosa; Donata Nicolosi; Giovanni Sicurella; Luigi Occhipinti

Publisher: Elsevier Science
Year: 2009
Tongue: English
Weight: 555 KB
Volume: 10
Category: Article
ISSN: 1566-1199
DOI: 10.1016/j.orgel.2009.05.019

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