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Microstructures for characterization of seebeck coefficient of doped polysilicon films

✍ Scribed by Jin Xie; Chengkuo Lee; Ming-Fang Wang; Julius Minglin Tsai

Book ID: 106186035
Publisher: Springer-Verlag
Year: 2010
Tongue: English
Weight: 679 KB
Volume: 17
Category: Article
ISSN: 0946-7076
DOI: 10.1007/s00542-010-1183-9

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