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Apparatus for measuring Seebeck coefficients of high-resistance semiconducting films

✍ Scribed by Trakalo, M.; Moore, C. J.; Leslie, J. D.; Brodie, D. E.

Book ID: 120828813
Publisher: American Institute of Physics
Year: 1984
Tongue: English
Weight: 790 KB
Volume: 55
Category: Article
ISSN: 0034-6748
DOI: 10.1063/1.1137812

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