Apparatus for measuring Seebeck coefficient and electrical resistivity of small dimension samples using infrared microscope as temperature sensor

✍ Scribed by Jaafar, W. M. N. Wan; Snyder, J. E.; Min, Gao

• Book ID: 120390252
• Publisher: American Institute of Physics
• Year: 2013
• Tongue: English
• Weight: 895 KB
• Volume: 84
• Category: Article
• ISSN: 0034-6748
• DOI: 10.1063/1.4805016