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Microstructure characterization of TiO2 nanowires fabricated by thermal evaporation process

✍ Scribed by Dariani, R.S.; Nafari Qaleh, Z.

Book ID
120582847
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
965 KB
Volume
542
Category
Article
ISSN
0040-6090

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## Abstract Silicon nanowires (NWs) fabricated by thermal evaporation of SiO were studied by cathodoluminescence. A band around 1550 nm (0.8 eV) was observed. It appears above 225 K and its intensity increases with increasing temperature. The broad band consists of the defect‐related D1 and D2 line