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Microstructure and shear strength evolution of Sn-Ag-Cu solder bumps during aging at different temperatures

✍ Scribed by Dezhi Li; Changqing Liu; Paul P. Conway


Book ID
110626658
Publisher
Springer US
Year
2006
Tongue
English
Weight
777 KB
Volume
35
Category
Article
ISSN
0361-5235

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