𝔖 Bobbio Scriptorium
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Microscopic mechanism for SiO2Si interface passivation: SiO double bond formation

✍ Scribed by H. Kageshima; K. Shiraishi


Book ID
117217247
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
412 KB
Volume
380
Category
Article
ISSN
0039-6028

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