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Ellipsometric investigation of the Si/SiO2 interface formation for application to highly reflective dielectric mirrors

✍ Scribed by B Gallas; S Fisson; A Brunet-Bruneau; G Vuye; J Rivory


Book ID
114085307
Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
204 KB
Volume
377-378
Category
Article
ISSN
0040-6090

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