Micro-Raman spectroscopy characterization of polycrystalline silicon films fabricated by excimer laser crystallization
โ Scribed by Chil-Chyuan Kuo
- Publisher
- Elsevier Science
- Year
- 2009
- Tongue
- English
- Weight
- 593 KB
- Volume
- 47
- Category
- Article
- ISSN
- 0143-8166
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
## Abstract Thin polycrystalline diamond films were synthesized on silicon substrate by Hot Filament Chemical Vapor Deposition (HF CVD) technique from a mixture of hydrogen and different content of methyl alcohol. A comparative study on the Electron Paramagnetic Resonance (EPR), Raman spectroscopy
The Raman spectra of silicon nanocrystals embedded in silicon oxide and in porous silicon were measured at various laser powers. It was found that the Si-Si stretching Raman peak shifts to lower wavenumbers and broadens when the laser power increases. The effect is significant and reversible, i.e. t