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Micro-friction and adhesion measurements for si wafer and TiB2 thin film

✍ Scribed by Qing, Tao; Shao, Tianmin; Wen, Shizhu

Book ID: 108485023
Publisher: Bioline International
Year: 2007
Tongue: English
Weight: 325 KB
Volume: 12
Category: Article
ISSN: 1007-0214
DOI: 10.1016/s1007-0214(07)70039-1

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