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Mesa-sidewall gate leakage in InAlAs/InGaAs heterostructure field-effect transistors

✍ Scribed by Bahl, S.R.; Leary, M.H.; del Alamo, J.A.

Book ID: 114534713
Publisher: IEEE
Year: 1992
Tongue: English
Weight: 781 KB
Volume: 39
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.155875

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