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Enhanced CAD model for gate leakage current in heterostructure field effect transistors

✍ Scribed by Kie Young Lee; Lund, B.; Ytterdal, T.; Robertson, P.; Martinez, E.J.; Robertson, J.; Shur, M.S.

Book ID: 114536469
Publisher: IEEE
Year: 1996
Tongue: English
Weight: 886 KB
Volume: 43
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.502114

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