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Mechanisms of hot-carrier induced degradation of SOI (SIMOX) MOSFET's

✍ Scribed by A. Zaleski; D.E. Ioannou; G.J. Campisi; H.L. Hughes

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Hot carrier-induced degradation mechanis

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Hot-carrier degradation in ultra-thin fu

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Stress-bias dependence of hot-carrier-in

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Investigation of hot-carrier induced deg

✍ N. Revil; J.P. Miéville; S. Cristoloveanu; M. Dutoit; P. Mortini 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 295 KB

An analytical model for hot-carrier-indu

✍ Jung-Suk Goo; Young-Gwan Kim; Hyeokjae L'Yee; Ho-Yup Kwon; Hyungsoon Shin 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 595 KB

A new gate current measurement technique

✍ S.E Leang; W.K Chim; D.S.H Chan 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 680 KB